An Innovative Photonics Solutions Provider

The DLS100 is a compact, table top system that is specifically designed for smart card and semiconductor chip testing. 

 

Two water-cooled, flash lamp pumped, Q-switched Nd:YAG laser systems are optically beam combined and projected through a microscope onto the sample plane. One of the laser beam can be adjusted external with respective to the other beam in the field of view to carry out fault injection and detection scheme in the standard smart card testing process. 

 

The rugged industrial design is used to improve system stability in terms of optical performance and mechanical strength. As a result, the DLS100 system is relatively insensitive to vibration and temperature variation, it is easy to use and offers unprecedented test capability to users.

 

The DLS100 dual laser system is designed to provide great flexibility in selecting laser parameters for varous testing scenarios. Users can choose wavelength 1064 or 532 nm, set precise energy level from 0% to 100%, and adjust laser beam size with a push of a button on the Remote Laser Controller. A highly uniform spot size from 50 μm x 50 μm to 1 μm x 1 μm  can be readily achieved.